![](/cdn/assets/images/search/clock.png)
We could not find any results for:
Make sure your spelling is correct or try broadening your search.
Share Name | Share Symbol | Market | Type |
---|---|---|---|
NASDAQ:CSCD | NASDAQ | Common Stock |
Price Change | % Change | Share Price | Bid Price | Offer Price | High Price | Low Price | Open Price | Shares Traded | Last Trade | |
---|---|---|---|---|---|---|---|---|---|---|
0.00 | 0.00% | 21.86 | 18.00 | 27.50 | 0 | 01:00:00 |
Used in process development, process control, and device modeling, 1/f noise measurements are a key quality indicator for leading-edge semiconductor manufacturing processes. Occurring in all semiconductors, 1/f noise can compromise device performance by causing jitter or phase noise in communications devices, which results in high bit error rates. It can also cause random retention errors in flash memory or soft errors in SRAM. Flicker noise, a major contributor to device noise, is the gating barrier to reducing device operating voltages.
EDGE solutions address 1/f noise characterization for semiconductor devices, 1/f noise model parameter extraction, and process reliability evaluation using 1/f noise data. EDGE assures "noise-free" operation even when testing over a thermal range of -60 degrees C to 300 degrees C. The EDGE module and EDGE system offer multi-die and multi-site wafer stepping and have the lowest level of extrinsic noise, unmatched noise immunity, and the widest bandwidth (1 Hz to 40 MHz) in the market today.
The updated software provides intuitive 1/f noise measurement, extracts noise model parameters, and performs statistical analysis. Both the EDGE module and the fully integrated EDGE system now benefit from this enhanced software which supports 1/f noise characterization for FETs, BJTs, resistors, diodes, and varactors. The software consists of three components for 1/f noise solutions: the Measurement Tool for complete device characterization, the Analysis Tool for modeling and the Viewer Tool for statistical analysis and report generation.
"Our customers are demanding better noise immunity and wider bandwidth than current competitive solutions in the market today -- all with a lower cost of integration," said F. Paul Carlson, Chairman and CEO, Cascade Microtech, Inc. "Cascade Microtech is able to offer the only integrated system with its EDGE 1/f noise measurement solutions. These significantly increase measurement speed to provide a much faster modeling process. Combined with the enhanced measurement accuracy, our customers now have the right solution to reduce development costs while improving time-to-market."
About Cascade Microtech Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in the precise electrical and mechanical measurement and test of integrated circuits (ICs) and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, integrated circuits (ICs), IC packages, circuit boards and modules, MEMS, 3D TSV, LED devices and more. Cascade Microtech's leading-edge semiconductor production test products include unique probe cards and test sockets that reduce manufacturing costs of high-speed and high-density semiconductor chips. For more information visit www.cascademicrotech.com.
Cascade Microtech, Inc. and the Cascade Mictrotech logo are registered trademarks, and EDGE is a trademark of Cascade Microtech, Inc.
1 Year Chart |
1 Month Chart |
It looks like you are not logged in. Click the button below to log in and keep track of your recent history.
Support: +44 (0) 203 8794 460 | support@advfn.com
By accessing the services available at ADVFN you are agreeing to be bound by ADVFN's Terms & Conditions