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At the 14th European Microscopy Conference opening today, Bruker AXS
Microanalysis announced the European launch of several new products and
options for Scanning Electron Microscope (SEM) based materials analysis.
The innovative new QUANTAX CrystAlignTM
system for SEM-based crystallographic analysis via electron backscatter
diffraction (EBSD) consists of an ultra-fast EBSD detector and powerful,
yet easy-to-use EBSD analysis software that is seamlessly integrated
with Bruker’s EDS software, ESPRITTM.
The combination of EBSD with Energy Dispersive X-Ray Spectroscopy (EDS)
offers more comprehensive materials characterization capabilities in
Scanning Electron Microscopes for a broad range of applications on
metals, ceramics, and geological samples.
Dr. Gert Nolze, EBSD Product Manager at Bruker AXS Microanalysis,
commented: “The new Bruker CrystAlign EBSD
system provides several innovative capabilities: ultra-fast acquisition
rates of up to 750 patterns per second with the unique ability of
scanning the sample at a constant frame rate and storing the patterns as
a string of images for subsequent indexing and evaluation. This novel
EBSD collection strategy allows investigation of individual patterns and
re-analysis of the crystal orientation maps without repeated data
acquisition.”
Bruker AXS Executive Vice President Thomas Schuelein stated: “Bruker
has reached an important milestone in its microanalysis strategy, aimed
at further extending the versatility and analytical power of its product
lines for the micro- and nanoanalysis markets. The novel CrystAlign
system supplements the capabilities of our QUANTAX EDS system by
providing powerful tools for EBSD data acquisition, interpretation and
display of results, while making the EBSD technique more accessible to
the general microanalysis and SEM user.”
Bruker AXS Microanalysis also presents the XFlash®
5000 series of liquid nitrogen free XFlash®
silicon drift detectors (SDD) for use with its QUANTAX microanalysis
systems. These new detectors boast even further improved energy
resolutions down to 123 eV at Mn-K? and
100,000 cps input count rate. All detectors are equipped with an
optimized electron trap, which supports interference-free x-ray
detection, even at very low excitation energies. The new XFlash®
5000 family makes QUANTAX the ideal EDS X-ray system for nanoanalysis.
In addition, Bruker’s new ESPRIT Feature
software package extends the capabilities of the QUANTAX EDS analysis
systems for advanced particle analysis applications. ESPRIT Feature
utilizes the speed of both the QUANTAX image digitizer and the XFlash
EDS detector for fast particle identification and chemical
classification. Among its powerful image analysis functions are
configurable feature detection, and a convenient review function, as
well as chart and report generation. ESPRIT Feature allows automatic
unattended analysis of large samples or areas by preset methods for
detection, classification and result handling.
Bruker scientists will be available for discussions at the Bruker AXS
Microanalysis booth, E5.
ABOUT BRUKER AXS:
For more information about Bruker AXS and Bruker Corporation (NASDAQ:
BRKR), please visit www.bruker-axs.com
and www.bruker.com.