Bruker AXS Announces Closing of S.I.S. Acquisition and Exhibits its New Atomic Force Microscopy (AFM) Product Line at EMC 2008Th

  
    
  
  
    
      Bruker AXS GmbH announces the closing of its acquisition of S.I.S. 
      Surface Imaging Systems GmbH, located near Aachen, Germany. S.I.S. 
      develops, manufactures and distributes advanced atomic force/scanning 
      probe microscopy (AFM/SPM) systems for numerous applications in 
      materials research, including semiconductors, data storage, electronic 
      materials, solar cells, polymers and catalysts.
    
    
      S.I.S. will be renamed Bruker Nano GmbH and will operate under its 
      previous management. Starting today, Bruker’s 
      new AFM product line will be exhibited at the 14th 
      European Microscopy Congress (EMC 2008, September 1-5), also in Aachen, 
      Germany.
    
    
      Dr. Frank Burgaezy, Bruker AXS Executive Vice President, commented: “The 
      new Bruker high-performance AFM products range from small bench-top AFM 
      systems, to integrated high-end AFM/optical microscope combinations, all 
      the way to large floor standing instruments for the characterization of 
      300mm wafers in clean room environments. The impressive S.I.S. core 
      technology consists of extremely compact AFM/SPM components which can be 
      used easily with many instruments such as optical microscopes or 
      micro-hardness testers. We are very pleased to have S.I.S. join the 
      Bruker group, and further enhance our extensive high-performance 
      materials research and QC product lines.”
    
    
      “The most widely distributed S.I.S. product is 
      the ULTRAObjective™, an extremely 
      compact AFM add-on unit which can be easily integrated with standard 
      optical microscopes. This straightforward integration provides direct 
      access to the nanoworld, without compromise,” 
      added S.I.S. Managing Director Dr. Frank Saurenbach.
    
    
      The PICOStation™ system is an AFM/SPM 
      stand-alone instrument achieving atomic resolution. With optional 
      upgrades, the functionality can be expanded to a full-fledged AFM/SPM 
      research tool. The options range from non-contact, MFM/EFM and force 
      spectroscopy modes to measurements of friction and adhesion properties, 
      all the way to resistance/work function characterization. A liquid 
      immersion system is also available.
    
    
      Combined with the optics of a research-grade optical microscope, the NANOStation™ 
      II is a high performance inspection system. This robust instrument 
      provides resolution in the sub-nanometer range and accepts various 
      sample sizes. The easy handling of both the optical inspection and the 
      AFM tool makes the NANOStation II a workhorse in every lab where 
      accuracy, stability and reliability are of concern.
    
    
      With the NANOStation™ HD, Bruker now 
      provides an AFM inspection tool that provides resolution in the 
      sub-Angstrom range and operates with under automation. Initially 
      developed for the routine characterization of defects on hard disks, the NANOStation 
      HD has evolved to a widely used premium AFM in various industrial 
      applications. It allows preselecting multiple scanning locations with 
      the integrated optical microscope, and subsequently running fully 
      automatic AFM measurements. With its macro-programming capability, the 
      user can even implement measurement cycles and methods. The NANOStation 
      HD can be equipped with R-? or X-Y stages 
      and handles sample sizes up to 100mm.
    
    
      The NANOStation™ 300 AFM/SPM tool is 
      another highlight of the new Bruker AFM product range. It combines the 
      ability to inspect large samples with sizes up to 300 mm with a premium 
      resolution of better than 0.05 nm. The rock-solid platform consists of 
      granite with integrated air-bearing stages for fast positioning and high 
      repeatability. Targeting the semiconductor market, the NANOStation 300 
      is clean room compatible and provides automated measurements. Coordinate 
      files of various formats can be imported and used for finding and 
      identifying defects. The NANOStation 300 is made for wafer 
      inspection, mask metrology, solar panel characterization, and other 
      applications where large samples need to be inspected with highest 
      accuracy. Besides AFM, the NANOStation 300 can be equipped with 
      optical, confocal, Laser scanning, Raman microscopy or other inspection 
      tools.
    
    
      ABOUT BRUKER AXS:
    
    
      For more information about Bruker AXS and Bruker Corporation (NASDAQ: 
      BRKR), please visit www.bruker-axs.com 
      and www.bruker.com.