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VRGY Verigy Ltd. (MM)

15.00
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Last Updated: 01:00:00
Delayed by 15 minutes
Share Name Share Symbol Market Type
Verigy Ltd. (MM) NASDAQ:VRGY NASDAQ Common Stock
  Price Change % Change Share Price Bid Price Offer Price High Price Low Price Open Price Shares Traded Last Trade
  0.00 0.00% 15.00 0 01:00:00

ZMD Standardizes on Verigy V93000 SOC Series for Wafer Sort and Final Test of High-Performance Mission-Critical Devices

01/04/2008 3:00pm

Business Wire


Verigy Ltd. (MM) (NASDAQ:VRGY)
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Verigy (NASDAQ: VRGY), a leading semiconductor test company, today announced that ZMD AG has standardized on the V93000 SOC Series for wafer sort and final test of its high-end, mission-critical signal conditioning devices. ZMD is a leading global supplier of analog and mixed-signal solutions for automotive, industrial, medical, and consumer applications. ZMD has added incremental V93000 capacity to its test floor for dedicated, highly parallel wafer sort – testing 16 devices simultaneously. The unique parallel test capability of the V93000 optimizes ZMD’s cost-of-test (CoT). “We have been using the V93000 for four years now, and as a result of that experience, we have tremendous confidence in Verigy solutions as well as in Verigy support,” said Ralf Petzoldt, Test Manager at ZMD. “The V93000 is the only tester available that addresses our cost-of-test needs with parallel test at wafer sort. In reference to the ITRS(1), we achieve a mixed-signal wafer multi-site efficiency of 91 percent with the V93000.” “Quality and reliability are of paramount importance in the medical and automotive environments where mission-critical devices such as sensor signal conditioners are widely used,” said Pascal Ronde, Vice President of Sales, Service and Support, Verigy. “The V93000 offers the specific capabilities that ZMD needs to confirm all of the required safety metrics for its devices. In addition, massively parallel test is required not only for the cost sensitivity of these markets but also to ensure ZMD’s long-term return on investment in semiconductor test. The V93000 delivers on all scores.” About the Verigy V93000 The Verigy V93000 provides a scalable platform architecture for testing SoCs, systems-in-package (SIPs) and high-speed memory devices. The V93000, with more than 1,500 RF-ready systems installed worldwide, meets the industry’s demanding performance and cost challenges, whether for at-speed engineering characterization or high-volume production. The test system provides low cost-of-test with massive multi-site capabilities, with data rates up to 12.8 Gbps and supports a full range of digital, mixed-signal, RF and wireless applications, such as cellular, WLAN, WiMAX, and UWB. About ZMD AG Founded in 1961, ZMD AG is a leading supplier of analog and mixed-signal integrated circuits for applications in automotive, mobile medical appliances, and industrial automation. ZMD specializes in design and marketing of high temperature, high voltage and ultra low power application-specific integrated circuits (ASICs) and application-specific standard products (ASSPs). Its advanced circuit-design expertise allows it to offer ICs with operating temperatures as high as +160°C, and voltages from 0.85 V to 40 V. Headquartered in Dresden, Germany, ZMD has 250 employees worldwide and serves customers from the company’s offices in Melville, NY; Stuttgart, Germany; Newcastle, England; Paris, France; Tokyo, Japan; Hsinchu City, Taiwan and Bangalore, India. ZMD has design centers in Dresden, Stuttgart, Melville and Madison, Wisconsin. More information is available at www.zmd.biz. About Verigy Verigy designs, develops, manufactures, sells and services advanced test systems and solutions for the memory and system-on-chip segments of the semiconductor industry. Verigy’s scalable platform systems are used by leading semiconductor companies worldwide in design validation, characterization, and high volume manufacturing test. Information about Verigy can be found at www.verigy.com. (1) Refer to page 36 of The International Technology Roadmap for Semiconductors: 2007 Edition, “Test and Test Equipment,” http://www.itrs.net/Links/2007ITRS/2007_Chapters/2007_Test.pdf.

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