Verigy Ltd. (MM) (NASDAQ:VRGY)
Historical Stock Chart
From Jul 2019 to Jul 2024
![Click Here for more Verigy Ltd. (MM) Charts. Click Here for more Verigy Ltd. (MM) Charts.](/p.php?pid=staticchart&s=N%5EVRGY&p=8&t=15)
Verigy Ltd. (NASDAQ:VRGY) today announced that it is
extending its joint development work with Cadence Design Systems
(NASDAQ:CDNS) to optimize interoperability between Verigy's V93000 SOC
test system and the Cadence(R) Encounter(R) Test family of products to
improve time-to-yield.
The project seeks to enable more efficient volume diagnostics with
these systems by combining the power of the scalable, per-pin
architecture and capabilities of the V93000 and the Cadence Encounter
Diagnostics product for data collection, storage and analysis for
large complex devices. This joint project will allow large quantities
of failure data to be efficiently brought from the V93000 in a secure
format for both batch and real-time analysis by the Encounter
diagnostic tool. The results of the collaboration will be available to
current and future customers of V93000 Pin Scale systems also using
Cadence Encounter Test to improve time-to-yield.
The Verigy and Cadence teams are also exploring real-time and
low-overhead adjustments to the test and diagnostics flow for
multi-site testing. Their goal is to obtain the best possible
diagnostic data for yield enhancement.
"Time-to-yield is of critical importance for the entire
semiconductor industry," said Pascal Ronde, Verigy vice president of
sales, service and support. "Successful solutions for fastest yield
ramp have to bring together the expertise of ATE and EDA companies.
This collaboration will allow our joint customers to achieve higher
return on their investment in test in high-volume manufacturing
environments through more efficient yield diagnostics flow."
"This level of collaboration between ATE and diagnostics is
unprecedented and will shorten detection time to the source of yield
loss for Cadence and Verigy customers," said Sanjiv Taneja, vice
president of R&D for Encounter Test at Cadence. "Tackling these issues
shows the strong commitment both Cadence and Verigy have to optimize
the test and diagnostics flow to help mutual customers achieve faster
yield ramp."
This collaboration builds on last year's joint project, in which
the two companies validated a test and diagnostic flow between
electronic design automation (EDA) and automated test equipment (ATE).
Forward-Looking Statements
This news release contains forward-looking statements that involve
risks and uncertainties, including statements regarding the
development, features and functionality of the products to be jointly
developed by Verigy and Cadence Design Systems. These forward-looking
statements are based on current information and estimates, and are not
guarantees of future performance or events. These forward-looking
statements are subject to a number of risks and uncertainties that
could cause actual events to differ materially from those in the
forward-looking statements. The risks and uncertainties include, but
are not limited to, our ability to successfully jointly develop the
new and complex products contemplated by our relationship with
Cadence, the compatibility of such products with our products and
uncertainties as to the marketability of such products if and when
they become available. Additional factors that may cause events to
differ materially from those in the forward-looking statements are
discussed in our registration statement on Form S-1, filed with and
declared effective by the SEC on June 12, 2006. Verigy undertakes no
duty to update the forward-looking statements herein.
About Verigy
Verigy designs, develops, manufactures and sells advanced test
systems and solutions for the semiconductor industry. Verigy comprises
the semiconductor test business recently separated from Agilent
Technologies. The company began doing business as Verigy on June 1,
and completed its initial public offering on June 12, 2006.
Information about Verigy can be found at www.verigy.com.