Verigy Ltd. (MM) (NASDAQ:VRGY)
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Verigy (NASDAQ:VRGY), a premier semiconductor test company, today
introduced the V93000 Nanoelectronics Digital solution for structural
and functional test for wafer sort and final test of advanced digital
ICs at 65nm and beyond. By providing accurate diagnostic and parametric
data, the Nanoelectronics Digital solution allows manufacturers to
target new failure mechanisms that reduce manufacturing yield at 65nm
and smaller, a key challenge in the migration to new smaller nodes. The
solution delivers insights that benefit new designs and does so
efficiently, accelerating time-to-market at the lowest cost-of-test
(CoT).
“The nanoelectronics era challenges
conventional wisdom about the role of test in the manufacturing flow,”
said Pascal Ronde, vice president of sales, services and support,
Verigy. “Automated test equipment is
relinquishing its role as simply a pass/fail tool, and becoming a
critical yield-enhancement tool for high volume manufacturing. Our new
solution will allow V93000 users to collect accurate diagnostic and
parametric data required for testing nanoelectronics, and its multi-site
efficiency will set a new standard in productivity.”
As they move to process nodes at 65nm and smaller, manufacturers are
facing test challenges caused by new failure mechanisms, such as
transition and bridging faults, design process interaction and inter-
and intra-die variations. The challenge is made greater by growing scan
vector volumes, plus more use of on-chip compression and built-in
self-test (BIST) structures. Measurement accuracy also becomes more
critical due to the lower voltages and higher speeds typical with
smaller geometries, in addition to the integration of performance analog
and DC. With the challenging initial yields in nanoelectronics, accurate
measurements have taken on new importance for closing the loop between
test and design to enable rapid yield learning and improvement.
Verigy recognizes the imperative for a solution that allows maximum
insight while achieving the highest possible manufacturing efficiency,
including rapidly moving the data off the tester for volume yield
diagnostics. It allows manufacturers to take advantage of the latest
test methodologies, such as more multi-site, reduced pin count access,
and loop-back methodologies, while reducing data collection to only the
most relevant information.
Integrated Hardware for Optimal Throughput
Verigy incorporates the industry's highest functionality per square
centimeter onto single slot cards inserted into the V93000 test head,
for smaller tester footprint and lower cost. The V93000 Nanoelectronics
Digital solution includes the following compact test head-based
configurations:
Pin Scale 400 digital pin card, scaling from DC IO to 533 Mbps;
Integrated large fail-data capture and ultra-fast data transfer;
DC Scale DPS32 -- 32 channels per card for testing multiple power;
domains in multi-site, and fast synchronous triggering for improved
repeatability and highest throughput;
STIL link package;
Integrated TIA per pin.
More information can be found at www.verigy.com/go/NanoDigital.
Pricing and Availability
The Nanoelectronics Digital solution starts at USD $499,000, and is
available now.
About the Verigy V93000
The Verigy V93000 provides a scalable architecture for testing SoCs,
system-in-packages (SIPs) and high-speed memory devices. The V93000, now
with more than 1,500 systems installed worldwide, meets the industry’s
demanding performance and cost challenges, whether for at-speed
engineering characterization or high-volume production. The test system
provides massive multi-site capabilities, with data rates up to 12.8
Gbps and supports a full range of digital, mixed-signal and RF
applications. It provides low cost-of-test for wireless applications
such as cellular, WLAN, WiMax, and UWB.
About Verigy
Verigy designs, develops, manufactures, sells and services advanced test
systems and solutions for the memory and system-on-chip segments of the
semiconductor industry. Verigy’s scalable
platform systems are used by leading semiconductor companies worldwide
in design validation, characterization, and high volume manufacturing
test. Formerly part of Agilent Technologies, the company began doing
business as Verigy on June 1, 2006, and completed its initial public
offering on June 13, 2006. Information about Verigy can be found at www.verigy.com.