Verigy Honored with 2009 Hot 100 Product Award for Design-for-Manufacturability Software Solution

Verigy (NASDAQ:VRGY), a premier semiconductor test company, has won EDN magazine’s 2009 Hot 100 Product award for its software toolset comprising the Triage Fault Locator™ and YieldVision™ Analysis and Visualization Tools, which work together to form the company’s Yield Learning Solution. Verigy is the only test equipment manufacturer to win in the software category.

The Yield Learning Solution facilitates design-for-manufacturability by providing the accuracy necessary in product development labs as well as the high throughput necessary for volume production. These performance characteristics are critical for both launching new products and ongoing manufacturing monitoring.

“To choose the 2009 lineup of the Hot 100, EDN’s editors examined thousands of new products across 16 product categories,” said Rick Nelson, EDN editor-in-chief. “Verigy’s Triage and YieldVision yield-learning tools were among the outstanding product introductions in our software category.”

Bridging design and test to enhance yield management, Verigy’s Triage and YieldVision software tools capture failure data and perform yield analysis. This enables design-centric analysis and visualization on Verigy’s V93000 SOC (system-on-chip) test platform by integrating on-tester, real-time capture and analysis of electrical failures on complex SOC devices.

The V93000’s scalable architecture allows for complete integration with the Yield Learning Solution. Triage software’s proprietary algorithms enable efficient data processing while YieldVision’s analysis and visualization capabilities reduce the time required to diagnose any problems. By seamlessly linking electrical testing with physical-layout data, these tools can quickly localize the sources of physical defects.

“This new software solution addresses the market’s need to close the loop between design, fabrication and test,” said Colin Ritchie, vice president of marketing for DfX Solutions at Verigy. “By providing this new means of efficiently identifying and fixing any design-for-manufacturability problems, we’re helping our customers to optimize their time to market and profitability.”

Whereas traditional approaches to yield diagnosis can require many days to identify design problems and generate unwieldy terabytes of data that must be reviewed and analyzed, Verigy’s on-tester approach generates much more focused kilobytes of data and delivers those results in just minutes. Results from Verigy customers show as much as a four-week acceleration in time to market, an increase in entitlement yield of up to 6 percent, and a tenfold reduction in the number of wafers required to reach entitlement yield.

About Verigy

Verigy provides advanced semiconductor test systems and solutions used by leading companies worldwide in design validation, characterization, and high-volume manufacturing test. Verigy offers scalable platforms for a wide range of system-on-chip (SOC) test solutions, and memory test solutions for Flash, DRAM including high-speed memories, as well as multi-chip packages (MCP). Verigy also provides advanced analysis tools that accelerate design debug and yield ramp processes. Additional information about Verigy can be found at www.verigy.com.