Cascade Microtech Wins Two Awards for Tesla On-Wafer Power Semiconductor Device Characterization System

Tesla system recognized by industry-leading publications Electronic Products and Test & Measurement World 


BEAVERTON, Ore., Jan. 14  /PRNewswire-FirstCall/ -- Cascade Microtech today announced it has received the prestigious Product of the Year award from key industry publication Electronic Products for its Tesla power semiconductor device characterization system. Also in December, the Tesla system received an honorable mention from Test & Measurement World's Best in Test awards.

The Tesla system is the industry's only power device measurement system to provide a complete on-wafer solution for over-temperature, low contact resistance measurements of power semiconductors up to 60A and 3000V.

"The Tesla power device measurement system has reduced costs by eliminating the hassles of packaging devices before we characterize them," said Edouard de Fresart, power device section manager, SMARTMOS Technology Center, Freescale Semiconductor. "Wafer level characterization saves a great deal of development time."

Tesla was introduced in May of 2007. It was judged by the editors of Electronic Products and Test & Measurement World against nominated products released in the past year for its overall importance to the electronics industry at large. The Tesla system is featured in the January 2008 issue of both publications.

"We are obsessed with solving our customers' toughest probing challenges and Tesla is no exception," said Geoff Wild, CEO of Cascade Microtech. "This product is a perfect example of the value that Cascade Microtech brings to our customers. Quite simply, we enable measurements to be done at the wafer-level, saving them loads of development time and, in the end, making them more competitive."

About the Tesla Power Semiconductor Device Characterization System

The Tesla measurement system offers an on-wafer probing solution for measurements of power semiconductors up to 60A and 3000V over a temperature range of -55 C to +200 C. Exclusive chuck technology provides handling for wafers as thin as 100 microns and enables on-wafer measurements for devices up to 75W. Tesla's high-current parametric probe minimizes thermal runaway at the probe-to-wafer contact, while handling up to 10A of current in continuous mode and up to 60A of current in pulsed mode. A high-voltage parametric probe measures breakdown currents as low as