ADE Receives Multi-Tool Order From Major Asian Silicon Wafer Supplier; Inline Wafer Metrology Systems to Support Ongoing 300mm C

ADE Corporation (NASDAQ: ADEX) announced today that it
has received a multi-million dollar order for several advanced 300mm
wafer metrology tools from a leading Asian silicon wafer manufacturer.
Deliveries of ADE's inline nanotopography and wafer flatness and
geometry measurement systems are expected to be completed in the first
half of calendar 2006 to support this customer's ongoing 300mm silicon
wafer capacity expansion plans.
   "We are pleased to announce this follow-on order and look forward
to continuing our partnership with this long standing customer", said
Dr. Chris L. Koliopoulos, ADE's president and chief executive officer.
"This multi-system order highlights ADE's market leadership position
in providing a breadth of advanced inline metrology solutions that is
critical in achieving the yield initiatives of the semiconductor
industry" continued Dr Koliopoulos. "Continuing expansion of 300mm
wafer capacity, coupled with tighter performance specifications
required for shrinking design rules, are key factors supporting our
revenue growth strategy."
   Gartner Dataquest estimates that 300mm wafer demand will grow by
28.7% annually from 2006 to 2008. Fueling this growth in needed wafer
capacity, nineteen new semiconductor device fabs are planned to start
or ramp production on 300mm wafers over the next three years. In
response, all major wafer suppliers continue to invest in additional
300mm production capacity.
   Wafer suppliers and device manufacturers worldwide rely on ADE
inspection and measurement systems to certify and ensure the highest
quality bare silicon substrates. ADE's most recent generation of
products serve both 65nm inline manufacturing applications and 45nm
process development. Device yields begin with the bare wafer and ADE's
leading technology provides early insight to surface defect, shape,
flatness and nanotopography of advanced 300mm substrates.

   About ADE Corporation

   ADE Corporation is a leading supplier of metrology and inspection
systems for the semiconductor wafer, semiconductor device, magnetic
data storage and optics manufacturing industries. The Company's
systems analyze and report product quality at critical manufacturing
steps for yield enhancement, providing quality certification data that
is relied upon by semiconductor wafer, device and computer disk
manufacturers. The Company's systems also are used for production
measurements in the semiconductor chip fabrication process. To learn
more about ADE, visit the Company's Web site at www.ade.com.

   Safe Harbor

   This news release contains certain forward-looking statements that
are subject to known and unknown risks and uncertainties that could
cause actual results to differ materially from those expressed or
implied by such statements. Those statements that make reference to
the Company's expectations, predictions, beliefs, assumptions and
anticipations should be considered forward-looking statements. These
statements include, but are not limited to, those associated with the
shipment of product to the aforementioned silicon wafer supplier, the
effect of ADE products on customer product quality and production
rates, and expected 300mm silicon wafer demand. These statements
involve risks and uncertainties including those associated with wafer
pricing and wafer demand; the results of ADE's product development
efforts; and the success of it's product offerings to meet customer
needs within the timeframes required by customers in these markets.
Further information on potential factors that could affect ADE
Corporation's business is described in the Company's reports on file
with the Securities and Exchange Commission, including its Form 10-K
for the fiscal year ended April 30, 2005.