Free Keithley Web-Based Seminar Exposes the Secrets to Ensuring Accurate I-V Measurements

Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization” on Thursday, September 16, 2010. This one-hour presentation is designed to help laboratory engineers implement, troubleshoot, and verify pulsed I-V, transient I-V, and general Ultra-Fast I-V measurement systems and will provide the keys to getting good I-V measurements. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization is a follow-up to the material presented in Keithley’s Fundamentals of Ultra-Fast I-V on-line seminar. Topics to be discussed include system setup, typical measurement limitations, and results from some actual devices. Those who attend the seminar will learn:

• How to properly connect an Ultra-Fast I-V instrument to a probe station
• Common problems encountered when not properly cabled
• Tips on performance verification at the probe tips
• Limitations in Ultra-Fast I-V, including Johnson Noise and others
• Typical examples of Ultra-Fast I-V on sample devices

The on-line event also features an interactive question and answer session.

Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization is intended for those whose job requires performing all types of characterization measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining characterization equipment and probe stations will also benefit from this seminar.

Lee Stauffer, a senior staff technologist for Keithley Instruments’ Semiconductor Measurements Group in Cleveland, Ohio, will present the seminar. Prior to joining Keithley, Stauffer’s career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

Registration Information.Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization will be broadcast on Thursday, September 16, 2010 at 15:00 CEST (9:00 a.m. EDT) for the European audience and at 2:00 p.m. EDT for the North American audience. The event is free to the public, but participants must register in advance at www.keithley.com/events/semconfs/webseminars. The seminar will also be archived on Keithley’s website for those unable to attend the original broadcast.

For More Information.For more information on Keithley or any of its test solutions, visit www.keithley.com or contact the company at:

    
      
        
           
        
        
           
        
        
           
        
        
           
        
        
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          Keithley Instruments, Inc.
        
      
      
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
          28775 Aurora Road
        
      
      
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
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About Keithley Instruments, Inc.With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

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